Metrological large range magnetic force microscopy
نویسندگان
چکیده
منابع مشابه
A Large Range Metrological Atomic Force Microscope with Nanometer Uncertainty
A metrological atomic force microscope (AFM) with 50mm×50mm×2mm scan range has been designed and constructed. In this paper, the structure and preliminary results are introduced. The precise movement of the sample is driven by a piezoelectric motion stage and airbearing stage for different scanning range. Four multi-pass homodyne interferometers attached to the metrological frame measure the re...
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Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
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The remarkable outbreak of nanotechnologies and among these of nanobiotechnologies has been allowed by the invention, development, continuous improvement of different techniques and instrumentations for the imaging of materials and systems at the nanoscale. Among such techniques, atomic force microscopy (AFM) represents a well established technique for the imaging of a wide range of samples as ...
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In this work, the use of magnetic force microscopy (MFM) to acquire images of magnetic nanostructures in liquid environments is presented. Optimization of the MFM signal acquisition in liquid media is performed and it is applied to characterize the magnetic signal of magnetite nanoparticles. The ability for detecting magnetic nanostructures along with the well-known capabilities of atomic force...
متن کاملmagnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
magnetic force microscope ( mfm ) is a powerful technique for mapping the magnetic force gradient above the sample surface. herein, single-wall carbon nanotubes (swcnt) were used to fabricate mfm probe by dielectrophoresis method which is a reproducible and cost-effective technique. the effect of induced voltage on the deposition manner of carbon nanotubes (cnt) on the atomic force microscope (...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2018
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.5035175